IN-SITU X-RAY-DIFFRACTION STUDIES OF YBA2CU3OX LAALO3 INTERFACES

Authors
WILLIAMS SM WANG XK MAGLIC S TOELLNER TS LIN CT CAVANAGH MD DURAY SJ LUNDQUIST PM CHANG RPH KETTERSON JB
Citation
Sm. Williams et al., IN-SITU X-RAY-DIFFRACTION STUDIES OF YBA2CU3OX LAALO3 INTERFACES, Journal of applied physics, 75(10), 1994, pp. 5372-5374
Citations number
5
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
75
Issue
10
Year of publication
1994
Part
1
Pages
5372 - 5374
Database
ISI
SICI code
0021-8979(1994)75:10<5372:IXSOYL>2.0.ZU;2-8
Abstract
We report on the oriented growth by sputtering of YBCO/LaAlO3/YBCO S/I /S trilayers and YBCO/LaAlO3 multilayers using a new synchrotron compa tible multisource deposition chamber.