TOWARD A SURFACE PHOTOELECTRON DIFFRACTOMETER - A PROGRESS REPORT ON SELECTED ADVANCES AND AN ASSESSMENT

X-ray diffractometric determination of atomic structures in ordered bu lk systems is highly automated and has wide application. By contrast, surface crystallography, whether based on photon or electron scatterin g, is still in a relatively early stage of development. A summary is g iven of recent selected highlights in efforts to make progress toward surface photoelectron diffractometry and holography by our Berkeley-Pe nn State group. It is concluded that an automated photoelectron diffra ctometer is practical and desirable.