RELAXATION ENERGIES IN XPS AND XAES OF SOLID SULFUR-COMPOUNDS

Solid sulfur compounds have been investigated by XPS/XAES chemical shi ft measurements of the S Is, S 2p, and S KLL peaks. Auger parameters a rid relaxation energies have been derived. The relaxation energy was d iscussed in terms of initial state charge and dielectric screening mod els. A local screening model was used to calculate relaxation energy s hifts semiquantitatively. The effect of crystal water has been illustr ated. A comparison of trends in the relaxation energy of the third row elements silicon, phosphorus and sulfur shows striking similarities