XPS METHOD FOR NEAR-SURFACE ANALYSIS OF MG IN MAGNESIUM COMPOUNDS

Citation
Vt. Gritsyna et al., XPS METHOD FOR NEAR-SURFACE ANALYSIS OF MG IN MAGNESIUM COMPOUNDS, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 669-674
Citations number
8
Categorie Soggetti
Spectroscopy
ISSN journal
03682048
Volume
68
Year of publication
1994
Pages
669 - 674
Database
ISI
SICI code
0368-2048(1994)68:<669:XMFNAO>2.0.ZU;2-5
Abstract
Compositional modification of magnesium compounds MgO . nAl2O3 due to ion beam bombardment was investigated using XPS method. From the depen dence of escape depth of photoelectron on its energy there was estimat ed the Mg content in different near surface layers.