Vt. Gritsyna et al., XPS METHOD FOR NEAR-SURFACE ANALYSIS OF MG IN MAGNESIUM COMPOUNDS, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 669-674
Compositional modification of magnesium compounds MgO . nAl2O3 due to
ion beam bombardment was investigated using XPS method. From the depen
dence of escape depth of photoelectron on its energy there was estimat
ed the Mg content in different near surface layers.