XPS STUDY OF NONSTOICHIOMETRY FOR CHALCOPYRITE CRYSTAL

Authors
BUZANEVA E VDOVENKOVA T NEMOSHKALENKO V SENKEVICH A SHPAK A GUBANOVA A TAKIZAWA T SCHWAB C
Citation
E. Buzaneva et al., XPS STUDY OF NONSTOICHIOMETRY FOR CHALCOPYRITE CRYSTAL, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 727-730
Citations number
5
Categorie Soggetti
Spectroscopy
Journal title
Journal of electron spectroscopy and related phenomena → ACNP
ISSN journal
03682048
Volume
68
Year of publication
1994
Pages
727 - 730
Database
ISI
SICI code
0368-2048(1994)68:<727:XSONFC>2.0.ZU;2-M
Abstract
Electronic structure and composition of the needle-shaped CdSi(x)P(y) crystal native growth surface is investigated using XPS for the purpos e to study nature of nonstoichiometry for chalcopyrite crystal. We pro pose to use variation in the P 2p and Cd 3d electron binding energies for identification of substitutional and exchange defects for native g rowth surface of chalcopyrite crystal.