The former major problem in conventional Raman spectroscopy in the vis
ible range, the disturbing fluorescence of impurities, has now been el
iminated: Raman spectra can be excited by light quanta in the near-inf
rared range, the energy of which is too low to excite fluorescence spe
ctra. An inherent disadvantage of this technique, the nu4-dependence o
f the intensity of the Raman radiation, is compensated for by using in
terferometers, which are more powerful, by a factor of several hundred
, than grating spectrometers. Raman spectroscopy can now be applied to
analyses of 'real world samples'; bio materials, food, paintings, mic
ro electronics and 'new materials', as well as to quality control of r
aw materials, to production and product control without special sample
preparation. By using fiber bundles, Raman spectra can be recorded on
line at the sample site, in containers and in real time. For successf
ul recording of NIR FT Raman spectra of small samples a compromise bet
ween large lateral resolution and a large signal/noise ratio has to be
found. Its theoretical base and practical approach is discussed. Conf
ocal microscopes allow recording of NIR FT Raman spectra of small part
icles or inclusions. They can be coupled to the spectrometer by fiber
optics, so that they may be placed at some distance from the spectrome
ter. By using computer-driven x-y stages, systematic mapping of the di
stribution of specific compounds on the surface of different samples i
s possible with the FT Raman microscope, as well as with the ordinary
sample arrangement.