TIME AND TEMPERATURE RESOLVED X-RAY-DIFFRACTION FOR STUDIES OF SOLID-STATE REACTIONS AND PHASE-TRANSITIONS

Authors
JUEZLORENZO M KOLARIK V HERRMANN M ENGEL W EISENREICH N
Citation
M. Juezlorenzo et al., TIME AND TEMPERATURE RESOLVED X-RAY-DIFFRACTION FOR STUDIES OF SOLID-STATE REACTIONS AND PHASE-TRANSITIONS, Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 163-165
Citations number
6
Categorie Soggetti
Chemistry Analytical
Journal title
Fresenius' journal of analytical chemistry → ACNP
ISSN journal
09370633
Volume
349
Issue
1-3
Year of publication
1994
Pages
163 - 165
Database
ISI
SICI code
0937-0633(1994)349:1-3<163:TATRXF>2.0.ZU;2-8
Abstract
Three examples for the application of time and temperature resolved X- ray diffraction for the investigation of solid state reactions and pha se transitions are given. Samples were submitted to an isothermal temp erature program or to stepwise heating/cooling, while diffraction patt erns were measured continuously. The applications include the in situ identification of reaction products or phases, the determination of ki netic parameters, the observation of thermal expansion and the formati on of layers.