TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LIGHT-ELEMENTS USING SYNCHROTRON-RADIATION

Synchrotron radiation from SSRL (Stanford Synchrotron Radiation Labora tory) Beam Line III-4 was used as excitation source for Total Reflecti on X-ray Fluorescence Analysis (TXRF) of light elements (Z < 14). Due to the outstanding features of synchrotron radiation this source is be st suited for the photon induced excitation of light elements offering a large number of photons in the energy range of interest. The high i ntensity and the natural collimation of the beam is ideal for total re flection geometry. The experiments were performed with a special TXRF spectrometer using an ultrathin window Ge(HP) detector for the energy dispersive measurement of light elements. BL III-4 is equipped with a cut-off mirror (E(cut) = 3 keV) for white beam measurements, and a dou ble multilayer monochromator can be inserted. Detection limits of some hundred femtograms have been obtained for Mg with the white beam exci tation. Boron could be detected with monochromatic excitation.