THE EFFECTS OF CLOSURE DOMAINS ON FLUX CONDUCTION IN THIN-FILM RECORDING HEAD

Citation
Zz. Guo et E. Dellatorre, THE EFFECTS OF CLOSURE DOMAINS ON FLUX CONDUCTION IN THIN-FILM RECORDING HEAD, Journal of applied physics, 75(10), 1994, pp. 6770-6772
Citations number
5
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
75
Issue
10
Year of publication
1994
Part
2B
Pages
6770 - 6772
Database
ISI
SICI code
0021-8979(1994)75:10<6770:TEOCDO>2.0.ZU;2-R
Abstract
The magnetic flux conductivity in the tip of a recording head was exam ined for various applied field and closure domain configurations using a two-dimensional micromagnetic model developed to obtain the domain patterns in soft magnetic thin films. A permalloy thin film sample was selected to simulate a monopole head configuration, and an external f ield was applied to various closure domain ground states that had zero net remanence magnetization. It was found that for small fields the m agnetization process is linear and reversible, and both the susceptibi lity and the effective track width increase as the size of the closure domains is reduced. For large fields, however, the variation of the f lux conduction is much less sensitive to the size of the zero-field cl osure domains, since the sample. is nearly saturated. Small jumps were observed in the magnetization curves corresponding to the domain wall nucleation and annihilation, which can be a source of head noise. It was also observed that the effective center of magnetic pole shifts wi th increasing field.