Previously, we have proposed a strategic dual image (SDI) method to ob
tain the finite element solution of open boundary magnetic field probl
ems. Also, we have derived a complex permeability from a Chua-type mag
netization model. Combination of this complex permeability with the SD
I method is now applied to exploit a new high frequency characteristic
measurement device for thin magnetic films. Numerical simulation sugg
ests that our new measurement method yields far superior results compa
red with those of the conventional one.