STUDYING TRANSIENT MOBILITY AND ENERGY-LOSS USING SCANNING-TUNNELING-MICROSCOPY

Authors
ABRAMS MJ WEISS PS
Citation
Mj. Abrams et Ps. Weiss, STUDYING TRANSIENT MOBILITY AND ENERGY-LOSS USING SCANNING-TUNNELING-MICROSCOPY, Surface science, 312(1-2), 1994, pp. 1-9
Citations number
39
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
312
Issue
1-2
Year of publication
1994
Pages
1 - 9
Database
ISI
SICI code
0039-6028(1994)312:1-2<1:STMAEU>2.0.ZU;2-R
Abstract
We show how scanning tunneling microscopy can be used to determine asp ects of transient mobility in the adsorption process, in chemical reac tions, and energy transfer processes at surfaces. For adsorption from the gas phase both the mean accommodation length and the promptness of energy loss can be elucidated using real space imaging.