FABRICATION AND OPTICAL CHARACTERIZATION OF WET CHEMICALLY ETCHED CDTE CDMGTE WIRES/

Citation
M. Illing et al., FABRICATION AND OPTICAL CHARACTERIZATION OF WET CHEMICALLY ETCHED CDTE CDMGTE WIRES/, Journal of crystal growth, 138(1-4), 1994, pp. 638-642
Citations number
10
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
138
Issue
1-4
Year of publication
1994
Pages
638 - 642
Database
ISI
SICI code
0022-0248(1994)138:1-4<638:FAOCOW>2.0.ZU;2-A
Abstract
We have fabricated optically active semiconductor wires based on CdTe/ CdMgTe quantum well structures by electron beam lithography and wet ch emical etching. Wire widths between 5 and 40 nm have been achieved. Th e wires have been characterized by photoluminescence spectroscopy. Dow n to about 300 nm, no significant decrease of the photoluminescence in tensity is observed at 5 K. In narrower wires, free excitons can diffu se to the open wire surface and recombine nonradiatively thereby causi ng a reduction of the quantum efficiency. Increasing the temperature u p to 100 K causes a larger diffusion length of free excitons which lea ds to a reduction of the quantum efficiency in small wires. Bound exci tons, which cannot diffuse towards the wire surface, show significantl y higher luminescence efficiency in narrow wires compared to free exci tons.