The X-ray long periods from high molecular weight injection molded pol
yethylene (PE) with a shish-kebab structure have been compared with va
lues derived from electron micrographs. It is shown that while small a
ngle X-ray scattering (SAXS) presents two long periods, the direct mea
surements from transmission electron microscopy (TEM) furnish only the
lower SAXS periodicity. In an attempt to clarify this discrepancy of
results, laser light diffraction and Fourier transformation of electro
n micrographs have been undertaken. Using this method two long periods
are found in all regions investigated. Results are discussed in terms
of the role played by the structured or ''weakly crystalline'' interl
amellar parts, containing a lower electron density, which are neglecte
d by the small angle scattering of X-rays and which give rise in parti
cular regions to larger scattering periodicities.