DETERMINATION OF CALIBRATION LINE SLOPES IN XRF ANALYSIS USING ONE STANDARD .2. MONOCHROMATIC EXCITATION OF L-SERIES ELEMENTS

Authors
COETZEE PP OOSTHUIZEN N
Citation
Pp. Coetzee et N. Oosthuizen, DETERMINATION OF CALIBRATION LINE SLOPES IN XRF ANALYSIS USING ONE STANDARD .2. MONOCHROMATIC EXCITATION OF L-SERIES ELEMENTS, South African Journal of Chemistry, 49(3-4), 1996, pp. 76-78
Citations number
6
Categorie Soggetti
Chemistry
Journal title
South African Journal of Chemistry → ACNP
ISSN journal
03794350
Volume
49
Issue
3-4
Year of publication
1996
Pages
76 - 78
Database
ISI
SICI code
0379-4350(1996)49:3-4<76:DOCLSI>2.0.ZU;2-H
Abstract
An algorithm is described to calculate the slopes of calibration lines for elements of the L-series for X-ray fluorescence analysis by monoc hromatic excitation. The procedure is based on calculating the theoret ical variation in fluorescent intensity with atomic number and then no rmalizing the curve for a particular matrix type and experimental cond itions by using a known slope for one standard in the series.