NEUTRON-ACTIVATION ANALYSIS AND AN INVESTIGATION OF ELEMENT DISTRIBUTION IN THIN-FILM SEMICONDUCTOR STRUCTURES

Authors
DUTOV AG KOMAR VA SHIRYAEV SV LOBANOVA KE ZABRODSKAYA VV MOZHEIKO LP
Citation
Ag. Dutov et al., NEUTRON-ACTIVATION ANALYSIS AND AN INVESTIGATION OF ELEMENT DISTRIBUTION IN THIN-FILM SEMICONDUCTOR STRUCTURES, Journal of analytical chemistry, 49(1), 1994, pp. 69-80
Citations number
27
Categorie Soggetti
Chemistry Analytical
Journal title
Journal of analytical chemistry → ACNP
ISSN journal
10619348
Volume
49
Issue
1
Year of publication
1994
Pages
69 - 80
Database
ISI
SICI code
1061-9348(1994)49:1<69:NAAAIO>2.0.ZU;2-4