USE OF IMAGE TREATMENT FOR THE UNDERSTANDING OF THE INFLUENCE OF CRYSTAL DEFECTS IN PIEZOELECTRIC MATERIALS

Citation
M. Pilard et al., USE OF IMAGE TREATMENT FOR THE UNDERSTANDING OF THE INFLUENCE OF CRYSTAL DEFECTS IN PIEZOELECTRIC MATERIALS, Journal de physique. IV, 4(C2), 1994, pp. 53-60
Citations number
11
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
4
Issue
C2
Year of publication
1994
Pages
53 - 60
Database
ISI
SICI code
1155-4339(1994)4:C2<53:UOITFT>2.0.ZU;2-D
Abstract
the propagation of surface or bulk acoustic waves in piezoelectric mat erials has been studied using the time structure of synchrotron X-ray beam. A precise state of vibration may be frozen in a stroboscopic top ograph. The analysis of such images may be difficult since crystal def ects induce highly contrasted areas which mask interesting details. Nu merical image treatment give very efficient solutions to extract this ''hidden'' information. Fourier filtering is one of the methods and ha s been applied to the topographs, to study the interaction of the defe cts with the acoustic waves.