THERMAL IMPEDANCE MEASUREMENT OF SEMICONDUCTOR-LASERS

Authors
BHUMBRA BS THOMPSON GHB WRIGHT AP
Citation
Bs. Bhumbra et al., THERMAL IMPEDANCE MEASUREMENT OF SEMICONDUCTOR-LASERS, Electronics Letters, 30(10), 1994, pp. 793-794
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
30
Issue
10
Year of publication
1994
Pages
793 - 794
Database
ISI
SICI code
0013-5194(1994)30:10<793:TIMOS>2.0.ZU;2-Y
Abstract
Methods of measuring thermal impedance of lasers have traditionally co mpared devices under CW and pulsed current operation where it is assum ed that heating is negligible for the latter. This assumption is untru e as heating still occurs within the duration of the current pulse. Th e authors describe an improved method for the measurement of thermal i mpedance.