BASE ETCHED SELF-ALIGNED TRANSISTOR TECHNOLOGY FOR ADVANCED POLYEMITTER BIPOLAR-TRANSISTORS

Citation
Mj. Kumar et Dj. Roulston, BASE ETCHED SELF-ALIGNED TRANSISTOR TECHNOLOGY FOR ADVANCED POLYEMITTER BIPOLAR-TRANSISTORS, Electronics Letters, 30(10), 1994, pp. 819-820
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
30
Issue
10
Year of publication
1994
Pages
819 - 820
Database
ISI
SICI code
0013-5194(1994)30:10<819:BESTTF>2.0.ZU;2-F
Abstract
The authors report the fabrication of double selfaligned advanced bipo lar transistors using base etched selfaligned transistor technology (B ESTT). The main feature of these transistors is that the base and emit ter contacts are self-aligned although using only a single poly layer. The fabrication and DC electrical measurements are discussed.