Tp. Iglesias et al., A CONTRIBUTION TO THE MEASUREMENT OF PERMITTIVITY WITH THE SHORT-CIRCUITED LINE METHOD, IEEE transactions on instrumentation and measurement, 43(1), 1994, pp. 13-17
The elimination of the ambiguity in the short-circuited line method fo
r determining the dielectric permittivity by measuring the change in t
he position of the minimum for two similar frequencies is studied.This
quantity is used to uniquely determine the coefficients of an algebra
ic equation with a single physical solution. Ambiguity may or may not
be removed depending on the dielectric characteristics of the sample a
nd on the value of the ratio sample thickness/wavelength. The former a
re not known a priori and the latter is an experimental parameter, whi
ch can be varied. The influence of this parameter on the elimination o
f ambiguity is studied. Finally the analysis is compared to results of
measurements on several organic liquids.