A CONTRIBUTION TO THE MEASUREMENT OF PERMITTIVITY WITH THE SHORT-CIRCUITED LINE METHOD

Citation
Tp. Iglesias et al., A CONTRIBUTION TO THE MEASUREMENT OF PERMITTIVITY WITH THE SHORT-CIRCUITED LINE METHOD, IEEE transactions on instrumentation and measurement, 43(1), 1994, pp. 13-17
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
ISSN journal
00189456
Volume
43
Issue
1
Year of publication
1994
Pages
13 - 17
Database
ISI
SICI code
0018-9456(1994)43:1<13:ACTTMO>2.0.ZU;2-K
Abstract
The elimination of the ambiguity in the short-circuited line method fo r determining the dielectric permittivity by measuring the change in t he position of the minimum for two similar frequencies is studied.This quantity is used to uniquely determine the coefficients of an algebra ic equation with a single physical solution. Ambiguity may or may not be removed depending on the dielectric characteristics of the sample a nd on the value of the ratio sample thickness/wavelength. The former a re not known a priori and the latter is an experimental parameter, whi ch can be varied. The influence of this parameter on the elimination o f ambiguity is studied. Finally the analysis is compared to results of measurements on several organic liquids.