I. Martil et al., INFLUENCE OF DEFECTS ON THE ELECTRICAL AND OPTICAL CHARACTERISTICS OFBLUE-LIGHT-EMITTING DIODES BASED ON III-V NITRIDES, Journal of applied physics, 81(5), 1997, pp. 2442-2444
We have measured the electrical and optical properties of blue light-e
mitting diodes (LEDs) based on III-V nitrides. The current-voltage cha
racteristic is described by means of the relation I = I-0 exp(alpha V)
. In this equation alpha is temperature independent, suggesting a proc
ess of conduction by tunneling, as was recently reported also for blue
-green LEDs based on III-V nitrides [Appl. Phys. Lett. 68, 2867 (1996)
]. We explain the differences between blue and blue-green devices taki
ng into account the tunneling process across semiconductor interfaces,
in which a great number of defects is present. The light output inten
sity of the LED as a function of junction-voltage data reveals a depen
dence on the junction-voltage of the type L = L(0) exp(qV/1.4 KT), ind
icating that the radiative recombination path is via deep levels locat
ed at the forbidden gap. Furthermore, we find that the light output-cu
rrent characteristic follows a power law like L proportional to I-p. F
rom the analysis of data it appears that, contrary to expectations, th
e nonradiative centers are saturated at very low current values that a
re comparable to the values at which this saturation takes place in LE
Ds based on III-V arsenides with a low content of defects. (C) 1997 Am
erican Institute of Physics.