REFLECTIVITY MEASUREMENTS OF FEMTOSECOND CARRIER AND FIELD-DYNAMICS IN SEMICONDUCTORS

Citation
Ud. Keil et al., REFLECTIVITY MEASUREMENTS OF FEMTOSECOND CARRIER AND FIELD-DYNAMICS IN SEMICONDUCTORS, Applied physics letters, 64(24), 1994, pp. 3267-3269
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
64
Issue
24
Year of publication
1994
Pages
3267 - 3269
Database
ISI
SICI code
0003-6951(1994)64:24<3267:RMOFCA>2.0.ZU;2-J
Abstract
Carrier and field dynamics in a photoconductive switch are investigate d by voltage modulated reflectivity. Measurements are performed with s ingle, femtosecond pulsed and cw probe beams, and with pulsed pump and probe beams. We investigate the spatial dependence of the reflectivit y changes and show that for mode-locked probe light the signal at the positive electrode completely dominates the response. The comparison o f above and below bandgap excitation and reflectivity changes resolves the contributions of carrier-induced field changes and those due to t he modulation of the applied field. Photoconductive switches on p- and n-doped substrates show that field enhancement at the Schottky barrie rs has only secondary influence. We explain the results in terms of a two-dimensional field distribution which produces the largest field gr adient and hence acceleration of carriers at the electrodes and that t he higher mobility of electrons accounts for the dominant signal appea ring at the positive electrode.