SURFACE-RESISTANCE AND PENETRATION DEPTH OF YBA2CU3O7-DELTA THIN-FILMS ON SILICON AT ULTRAHIGH FREQUENCIES

Authors
JAEKEL C WASCHKE C ROSKOS HG KURZ H
Citation
C. Jaekel et al., SURFACE-RESISTANCE AND PENETRATION DEPTH OF YBA2CU3O7-DELTA THIN-FILMS ON SILICON AT ULTRAHIGH FREQUENCIES, Applied physics letters, 64(24), 1994, pp. 3326-3328
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
64
Issue
24
Year of publication
1994
Pages
3326 - 3328
Database
ISI
SICI code
0003-6951(1994)64:24<3326:SAPDOY>2.0.ZU;2-O
Abstract
The surface resistance R(s) and the absolute value of the magnetic pen etration depth lambda of ultrathin YBa2Cu3O7-delta filMS on silicon ar e determined by THz-pulse transmission experiments. We find a minimal value of R(s) for a film thickness of about 30 nn. The increase of R(s ) with film thickness above 30 nm reveals an increase of the density o f weak links possibly associated with the formation of microfractures even below the critical film thickness of 50-70 nm.