ANALYTICAL COLOR FLUORESCENCE ELECTRON-MICROSCOPY OBSERVATION OF LASER-DIODES

Citation
H. Saijo et al., ANALYTICAL COLOR FLUORESCENCE ELECTRON-MICROSCOPY OBSERVATION OF LASER-DIODES, Journal of Electron Microscopy, 43(2), 1994, pp. 77-83
Citations number
18
Categorie Soggetti
Microscopy
ISSN journal
00220744
Volume
43
Issue
2
Year of publication
1994
Pages
77 - 83
Database
ISI
SICI code
0022-0744(1994)43:2<77:ACFEOO>2.0.ZU;2-P
Abstract
Laser diodes with the multilayer heterostructure have been observed in cathodoluminescence (CL) images using an analytical color fluorescenc e electron microscope. An AlGaInP/GaInP chip, which is commercially av ailable as 670nm red laser diode, emits red CL from a part of the p-Al GaInP layer just above the p-GaInP layer and between the n-GaAs blocki ng layers. A chip that has no blocking layers emits only very weak red CL, which indicates the strong relation of CL with laser emission. In images of a CdZnSe/ZnSe diode that emits 5 30 nm blue laser light at room temperature, a blue CL emission appears which is much stronger in the n-type region, in particular in the n-ZnSSe cladding layer, than in the p-type region. Fade-out of the blue CL and/or appearance of yel low-red emission take place in the area including dislocations.