PHOTOINDUCED SCANNING-TUNNELING-MICROSCOPY OF INSULATING DIAMOND FILMS

Citation
Tw. Mercer et al., PHOTOINDUCED SCANNING-TUNNELING-MICROSCOPY OF INSULATING DIAMOND FILMS, Journal of applied physics, 75(12), 1994, pp. 8225-8227
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
75
Issue
12
Year of publication
1994
Pages
8225 - 8227
Database
ISI
SICI code
0021-8979(1994)75:12<8225:PSOIDF>2.0.ZU;2-1
Abstract
Insulating diamond films were imaged by scanning tunneling microscopy (STM) utilizing photoinduced bulk carrier transport to establish tunne ling currents. General comparisons of topographic STM images and atomi c force microscopy images acquired on the same sample demonstrate that submicrometer structures obtained in the images can be correlated. Th is observation establishes that the topography of an insulating surfac e such as diamond can be imaged under illumination by STM. The results suggest that local electronic structure of illuminated insulating sur faces can be probed using scanning tunneling spectroscopy.