Insulating diamond films were imaged by scanning tunneling microscopy
(STM) utilizing photoinduced bulk carrier transport to establish tunne
ling currents. General comparisons of topographic STM images and atomi
c force microscopy images acquired on the same sample demonstrate that
submicrometer structures obtained in the images can be correlated. Th
is observation establishes that the topography of an insulating surfac
e such as diamond can be imaged under illumination by STM. The results
suggest that local electronic structure of illuminated insulating sur
faces can be probed using scanning tunneling spectroscopy.