P. Simon et J. Ihlemann, ABLATION OF SUBMICRON STRUCTURES ON METALS AND SEMICONDUCTORS BY FEMTOSECOND UV-LASER PULSES, Applied surface science, 110, 1997, pp. 25-29
Citations number
12
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Ablation of submicron structures on nickel, aluminum, copper, chromium
, gold, silicon and germanium is presented by short ultraviolet laser
pulses (0.5 ps, 248 nm). Features like periodic line structures with a
line-spacing below 400 nm, and holes with characteristic sizes well b
elow 1 mu m are produced on the sample surface by single laser shot ex
posure. The structures are projection printed by a Schwarzschild-objec
tive (N.A. = 0.4) in air environment. A comparison of the morphology o
f ablation sites of various materials with different pulse durations (
100 fs-50 ps) is presented. The role of thermal diffusion effects is d
iscussed.