Active and adaptive thin film materials for 'smart' materials will lik
ely be a heterostructure of several types of applications. In this inv
estigation, TiNi shape memory thin films on Si(100) substrates with Ba
TiO3 and PbZr1-xTixO3 (PZT) as buffer layer were deposited by the puls
ed laser deposition method. The critical issues of deposition and proc
essing of shape memory ferroelastic and ferroelectric materials have b
een addressed to fabricate the thin film sensor-actuator heterostructu
res. Characterization of the films has been done by using X-ray diffra
ctometer and atomic force microscope techniques. The buffer layer of B
aTiO3 and PZT have been beneficial to grow crystalline quality TiNi fi
lms on Si(100) substrates.