CORRELATION BETWEEN PLASMA DYNAMICS AND THIN-FILM PROPERTIES IN PULSED-LASER DEPOSITION

Citation
Hs. Kwok et al., CORRELATION BETWEEN PLASMA DYNAMICS AND THIN-FILM PROPERTIES IN PULSED-LASER DEPOSITION, Applied surface science, 110, 1997, pp. 595-600
Citations number
15
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
110
Year of publication
1997
Pages
595 - 600
Database
ISI
SICI code
0169-4332(1997)110:<595:CBPDAT>2.0.ZU;2-T
Abstract
The pressure-distance scaling law for pulsed laser deposition is exami ned for several thin film systems. This scaling law is due to the plas ma dynamics occurring within the laser plasma plume near the location of the substrate. Time-of-flight studies of both ions and neutrals con firm the existence of an optimal velocity distribution for optimal fil m deposition. Fast ions play a major role in determining the quality o f the films deposited. They may provide surface activation of the film or induce damage to the film depending on their kinetic energies.