A method that uses the data of my tracing for optical waveguide tens d
iagnostics is described. This method permits a direct reconstruction o
f the optical characteristics of a waveguide without the optical or th
e physical thickness being measured. Conditions are determined for the
mathematical problem of diagnostics by ray tracing to have a unique s
olution, and a technique to obtain a numerical solution from noisy exp
erimental data is described.