RESOLUTION IN NONLINEAR LASER-SCANNING MICROSCOPY

Citation
J. Deitche et al., RESOLUTION IN NONLINEAR LASER-SCANNING MICROSCOPY, Journal of Microscopy, 174, 1994, pp. 69-73
Citations number
9
Categorie Soggetti
Microscopy
Journal title
ISSN journal
00222720
Volume
174
Year of publication
1994
Part
2
Pages
69 - 73
Database
ISI
SICI code
0022-2720(1994)174:<69:RINLM>2.0.ZU;2-8
Abstract
The lateral and depth resolution of nonlinear microscopy was studied s ystematically. Nonlinear microscopy can be classified into several cat egories depending on the coherence properties of the process that gene rates the imaging signal from the illuminating light, on whether a sin gle- or a two-beam geometry is used, and whether the optical setup is Type I or Type IT, An evaluation of the imaging equations shows that ( i) lateral and depth resolution improve with increasing nonlinearity, (ii) the differences between coherent and incoherent imaging diminish, and (iii) nonlinear imaging allows depth discrimination in Type I mic roscopy.