DOPPLER-FREE REFLECTION SPECTROSCOPY OF SELF-INDUCED AND KRYPTON-INDUCED COLLISIONAL SHIFT AND BROADENING OF CESIUM D(2) LINE COMPONENTS INOPTICALLY DENSE VAPOR

Authors
PAPAGEORGIOU N FICHET M SAUTENKOV V BLOCH D DUCLOY M
Citation
N. Papageorgiou et al., DOPPLER-FREE REFLECTION SPECTROSCOPY OF SELF-INDUCED AND KRYPTON-INDUCED COLLISIONAL SHIFT AND BROADENING OF CESIUM D(2) LINE COMPONENTS INOPTICALLY DENSE VAPOR, Laser physics, 4(2), 1994, pp. 392-395
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied
Journal title
Laser physics → ACNP
ISSN journal
1054660X
Volume
4
Issue
2
Year of publication
1994
Pages
392 - 395
Database
ISI
SICI code
1054-660X(1994)4:2<392:DRSOSA>2.0.ZU;2-X
Abstract
We show that FM selective reflection can be used for Doppler-free spec troscopy of an optically dense vapor only once the effects of the atom -surface interaction on the atomic lineshapes are well identified. We report here results obtained by this method in the case of a van der W aals-type attraction potential between the atoms of the vapor and the dielectric surface. Our values for line broadening and shift by Cs-Cs and Cs-Kr collisions, which discriminate for the first time each indiv idual hyperfine component, confirm previous measurements and theoretic al predictions.