Z-SCAN STUDIES IN THE THIN-SAMPLE AND THE THICK-SAMPLE LIMITS

Z-scan studies have been carried out on CS2 with a 6.5-ns, doubled Nd: YAG source. Sample thicknesses ranged from the nearly thin- through th e thick-sample regime. The data were analyzed with both an analytic th eory, correct to first order in irradiance, and a Gaussian Laguerre mo dal-decomposition modeling approach, correct to all orders. It was fou nd that the n2 values obtained through both methods of analysis were i n agreement to within 10%. The results also indicate that a suitable t hickness for a self-focusing optical power limiter is six times the Ra yleigh length in the medium.