Photocapacitance spectra in undoped, metal-organic vapor-phase-epitaxy
-grown GaN layers, in a range of a photon energies from 0.6 to 3.5 eV,
reveal two main persistent features: a broad increase of the capacita
nce from 2.0 to 2.5 eV, and a steep decrease at 1 eV, only observed af
ter a previous Light exposure to photon energies above 2.5 eV. A deep
trap (E(v)+1 eV) that captures photoelectrons from the valence band, a
fter being emptied with photons above 2.5 eV, is proposed as the origi
n of these features. Optical-current deep-level transient spectroscopy
results also show the presence of a trap at 0.94 eV above the valence
band, only detected after light excitation with photon energies above
2.5 eV. A correlation is found between the ''yellow band'' luminescen
ce intensity at 2.2 eV and the amplitude of the photocapacitance decre
ase at 1 eV, pointing to a deep trap at 1 eV above the valence band as
the recombination path for the yellow band. The detection of the yell
ow band with below-the-gap photoluminescence excitation supports the p
roposed model.