ROOM-TEMPERATURE GROWTH OF SUBMONOLAYERS OF SILICON ON SI(001) STUDIED WITH SCANNING-TUNNELING-MICROSCOPY

Citation
J. Vanwingerden et al., ROOM-TEMPERATURE GROWTH OF SUBMONOLAYERS OF SILICON ON SI(001) STUDIED WITH SCANNING-TUNNELING-MICROSCOPY, Physical review. B, Condensed matter, 55(7), 1997, pp. 4723-4730
Citations number
22
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
55
Issue
7
Year of publication
1997
Pages
4723 - 4730
Database
ISI
SICI code
0163-1829(1997)55:7<4723:RGOSOS>2.0.ZU;2-P
Abstract
Room-temperature deposited submonolayers of silicon on Si(001) are inv estigated using STM. The observed structures and the mechanisms leadin g to their formation are discussed. Isolated ad-dimers in different et ries are described and a kinetic model for their formation is deduced. It is shown how further growth occurs via the formation of 3-atom clu sters, which act as nucleation centers for the formation of two types of Linear structures. One of the line types is formed in the [110] dir ection, and has been observed before. The other is in the [310] direct ion. At a coverage of nearly 0.2 ML a kind of random network consistin g of segments of the two types of atomic lines is formed. Above 0.2 ML coverage these lines are converted into epitaxial dimer rows. A pathw ay for this conversion is proposed on the basis of experimental observ ations.