FERROMAGNETIC-RESONANCE OF FE(111) THIN-FILMS AND FE(111) CU(111) MULTILAYERS/

Ferromagnetic resonance at 9.4 GHz has been used to characterize sever al samples of Fe single-crystal films and Fe/Cu multilayers prepared b y electron-beam deposition on HF-etched, hydrogen-terminated Si(111). Resonance field data as a function of the field orientation in the fil m plane confirmed that Fe films and Fe/Cu multilayers grow epitaxially on Si(111) with excellent crystallinity in the [111] orientation. Mor eover, we have found that the (111) plane is unique among the principa l planes in cubic crystals, because it allows precise measurements of the small second-order and in-plane anisotropies as well as misorienta tions from the crystal plane.