Photoluminescence of highly Er-doped silicate glass films prepared by
sputter deposition and Er-doped GaAs films grown by metal-organic chem
ical vapor deposition (MOCVD) was investigated. Er-doped silica glass
films show a strong, room-temperature luminescence at 1.54 mum wavelen
gth, corresponding to the I-1(1 3/2) --> I-4(1 5/2) transition of Er3 (4f), with a fluorescence decay lifetime in the range of 2 ms. Oxygen
was found to play an important role in forming optically active erbiu
m ions. The non-radiative Auger-type process in Er-doped GaAs was esti
mated to be nearly five times that of the energy transfer process from
bound excitons to the Er'' ions, which subsequently resulted in the E
r-related light emission. Temperature-induced quenching of the emissio
n was found to be dominated by transitions with an activation energy o
f 74 meV.