PHOTOLUMINESCENCE OF HIGHLY ER-DOPED SILICA FILMS AND ER-DOPED GALLIUM-ARSENIDE

Citation
Hk. Kim et al., PHOTOLUMINESCENCE OF HIGHLY ER-DOPED SILICA FILMS AND ER-DOPED GALLIUM-ARSENIDE, Journal of luminescence, 60-1, 1994, pp. 220-222
Citations number
4
Categorie Soggetti
Optics
Journal title
ISSN journal
00222313
Volume
60-1
Year of publication
1994
Pages
220 - 222
Database
ISI
SICI code
0022-2313(1994)60-1:<220:POHESF>2.0.ZU;2-7
Abstract
Photoluminescence of highly Er-doped silicate glass films prepared by sputter deposition and Er-doped GaAs films grown by metal-organic chem ical vapor deposition (MOCVD) was investigated. Er-doped silica glass films show a strong, room-temperature luminescence at 1.54 mum wavelen gth, corresponding to the I-1(1 3/2) --> I-4(1 5/2) transition of Er3 (4f), with a fluorescence decay lifetime in the range of 2 ms. Oxygen was found to play an important role in forming optically active erbiu m ions. The non-radiative Auger-type process in Er-doped GaAs was esti mated to be nearly five times that of the energy transfer process from bound excitons to the Er'' ions, which subsequently resulted in the E r-related light emission. Temperature-induced quenching of the emissio n was found to be dominated by transitions with an activation energy o f 74 meV.