TIME-RESOLVED REFLECTIVITY MEASUREMENTS OF THE AMORPHOUS-TO-GAMMA ANDGAMMA-TO-ALPHA PHASE-TRANSITIONS IN ION-IMPLANTED AL2O3

Authors
MCCALLUM JC SIMPSON TW MITCHELL IV
Citation
Jc. Mccallum et al., TIME-RESOLVED REFLECTIVITY MEASUREMENTS OF THE AMORPHOUS-TO-GAMMA ANDGAMMA-TO-ALPHA PHASE-TRANSITIONS IN ION-IMPLANTED AL2O3, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 91(1-4), 1994, pp. 60-62
Citations number
3
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
91
Issue
1-4
Year of publication
1994
Pages
60 - 62
Database
ISI
SICI code
0168-583X(1994)91:1-4<60:TRMOTA>2.0.ZU;2-#
Abstract
Time resolved optical reflectivity (TRR) has been used to measure the growth kinetics associated with the amorphous-to-gamma and gamma-to-al pha phase transitions in ion-beam amorphised c-axis oriented alpha-Al2 O3. The optical reflectivity technique allows the recrystallisation be haviour to be monitored dynamically during regrowth so that the growth kinetics associated with the two phase transitions can be measured si mply and accurately from a relatively small number of samples. The amo rphous-to-gamma and gamma-to-alpha phase transitions were studied over the temperature ranges of 670-770-degrees-C and 900-1070-degrees-C, r espectively. The growth kinetics obtained for the two transitions are compared to previous work.