Rm. Papaleo et al., ELECTRONIC SPUTTERING OF CARBON CLUSTERS FROM ION-BEAM IRRADIATED ORGANIC FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 91(1-4), 1994, pp. 677-681
Positive ions of even numbered carbon clusters C2n+ (n > 20) are eject
ed as a result of the interaction of fast MeV ions with poly(vinyliden
e fluoride) (PVDF). Experiments provide circumstantial evidence that t
hese ejected carbon clusters have a three-dimensional structure, consi
sting of pentagons and hexagons, i.e. they are fullerenes. We have stu
died the effect of macroscopic carbonisation induced by ion bombardmen
t on the ejection of carbon cluster ions (C(n)+, n = 1-33; C2n+ , n =
21-50) from PVDF. Damage cross-section values are extracted from the f
luence dependence of the secondary ion yields. The yield of fullerene
ions from PVDF decreases as a function of MeV ion fluence. Accordingly
, macroscopic carbonisation of the polymer is detrimental and is not a
prerequisite to fullerene emission, confirming earlier findings that
these carbon clusters are formed and ejected in a single MeV ion impac
t basis. For comparison, the sputtering of carbon cluster ions origina
ting from films of poly(tetrafluorethylene), poly(styrene), poly(ethyl
ene terephthalate) and fluorinated fullerene have also been studied.