PHOTOCONDUCTIVITY CHARACTERISTICS OF POROUS SILICON

Citation
Kf. Liu et al., PHOTOCONDUCTIVITY CHARACTERISTICS OF POROUS SILICON, Chinese Physics Letters, 11(5), 1994, pp. 289-292
Citations number
6
Categorie Soggetti
Physics
Journal title
ISSN journal
0256307X
Volume
11
Issue
5
Year of publication
1994
Pages
289 - 292
Database
ISI
SICI code
0256-307X(1994)11:5<289:PCOPS>2.0.ZU;2-2
Abstract
The highly photo-sensitive characteristics of porous silicon (PS) were observed. The transient behaviors of photoconductivity in horizontal and perpendicular directions of PS surface were very different, though both of them include two decay components. The photoconduction spectr a at room temperature and 14.5 K show that characteristics of PS are d ifferent from those of silicon substrate. The difference may be attrib uted to quantum confinement effect ia nano-size microstructures of PS.