The highly photo-sensitive characteristics of porous silicon (PS) were
observed. The transient behaviors of photoconductivity in horizontal
and perpendicular directions of PS surface were very different, though
both of them include two decay components. The photoconduction spectr
a at room temperature and 14.5 K show that characteristics of PS are d
ifferent from those of silicon substrate. The difference may be attrib
uted to quantum confinement effect ia nano-size microstructures of PS.