OPTICAL-CONSTANTS OF CDS THIN-FILMS PREPARED BY SPRAY-PYROLYSIS

CdS thin films were prepared by spray pyrolysis techniques. Variable a ngle spectroscopic ellipsometry was used for optical constant calculat ions. Multiple angle measurements were taken in the most sensitive ang le of incidence region. The sensitive regions of angle of incidence we re obtained theoretically using 3-dimensional graph of deltapsi and de ltaDELTA. Real part n and imaginary part k of the complex refractive i ndex of the samples were calculated in the wavelength range 470-650 nm , taking into account surface roughness. Bruggeman's effective medium approximation is used for analysis of the surface rough layer of the t hin films.