REMEASUREMENT OF CHARACTERISTIC X-RAY-EMISSION LINES AND THEIR APPLICATION TO LINE-PROFILE ANALYSIS AND LATTICE-PARAMETER DETERMINATION

The CuK(alpha) and CuK(beta) emission lines are remeasured with high a ccuracy. Analytical models of these profiles are obtained by fitting t hem with sums of n Lorentz functions. The wavelengths of the lines are determined in the metrical system with an accuracy superior to values obtained by other authors. The models are used for the X-ray diffract ion line profile analysis of polycrystalline materials and for the det ermination of lattice parameters with high accuracy. It is proposed to use the independently measured and fitted emission lineshape (wavelen gth distribution) in X-ray line profile analysis for the modelling of the line profile to improve the conditions for determining the structu re parameters of polycrystalline materials. An example for an applicat ion is given where the precise measurement of the CuK(alpha) emission lineshape is used to analyze molybdenum polycide samples. The lattice parameters of alpha-Fe whiskers are determined with an accuracy about one or two orders higher than in literature. The values are given also in the metrical system.