J. Hartwig et al., REMEASUREMENT OF CHARACTERISTIC X-RAY-EMISSION LINES AND THEIR APPLICATION TO LINE-PROFILE ANALYSIS AND LATTICE-PARAMETER DETERMINATION, Physica status solidi. a, Applied research, 143(1), 1994, pp. 23-34
The CuK(alpha) and CuK(beta) emission lines are remeasured with high a
ccuracy. Analytical models of these profiles are obtained by fitting t
hem with sums of n Lorentz functions. The wavelengths of the lines are
determined in the metrical system with an accuracy superior to values
obtained by other authors. The models are used for the X-ray diffract
ion line profile analysis of polycrystalline materials and for the det
ermination of lattice parameters with high accuracy. It is proposed to
use the independently measured and fitted emission lineshape (wavelen
gth distribution) in X-ray line profile analysis for the modelling of
the line profile to improve the conditions for determining the structu
re parameters of polycrystalline materials. An example for an applicat
ion is given where the precise measurement of the CuK(alpha) emission
lineshape is used to analyze molybdenum polycide samples. The lattice
parameters of alpha-Fe whiskers are determined with an accuracy about
one or two orders higher than in literature. The values are given also
in the metrical system.