Depth profiles of fluorine in F-19+ implanted tantalum have been accur
ately measured using the F-19(p, alphagamma)O-16 resonance nuclear rea
ction at E(R) = 872.1 keV. In order to extract the range distribution
of implanted fluorine from the experimental excitation yield curve, a
proper convolution calculated method is presented, from which the rang
e distribution parameters, such as the average projected range R(p), t
he projected range straggling DELTAR(p), and the skewness of the range
distribution SK, were obtained.