Ra. Vandermeer et Dj. Jensen, MODELING MICROSTRUCTURAL EVOLUTION OF MULTIPLE TEXTURE COMPONENTS DURING RECRYSTALLIZATION, Acta metallurgica et materialia, 42(7), 1994, pp. 2427-2436
Models were formulated in an effort to characterize recrystallization
in materials with multiple texture components. The models are based on
a microstructural path methodology (MPM). Experimentally the microstr
uctural evolution of conmmercial aluminum during recrystallization was
characterized using stereological point and lineal measurements of mi
crostructural properties in combination with EBSP analysis for orienta
tion determinations. The potential of the models to describe the obser
ved recrystallization behavior of heavily cold-rolled commercial alumi
num was demonstrated. A successful MPM model was deduced which, for ea
ch texture component-random, rolling and cube orientations, was quanti
tatively consistent with the measured microstructural properties. Nucl
eation and growth rates were deduced for each texture component using
the model.