APPLICATION OF TEST METHOD 1019.4 TO NONHARDENED POWER MOSFETS

Citation
P. Khosropour et al., APPLICATION OF TEST METHOD 1019.4 TO NONHARDENED POWER MOSFETS, IEEE transactions on nuclear science, 41(3), 1994, pp. 555-560
Citations number
20
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
41
Issue
3
Year of publication
1994
Part
1
Pages
555 - 560
Database
ISI
SICI code
0018-9499(1994)41:3<555:AOTM1T>2.0.ZU;2-P
Abstract
The applicability of MIL-STD-883D Method 1019.4 to predicting the low- dose-rate radiation response of non-hardened power MOSFETs has been in vestigated. Method 1019.4 works well in providing bounds for the thres hold-voltage shift. However, it is not intended to provide an estimate of the actual DELTAV(T) due to low-dose-rate irradiation. A modified method is proposed which can yield more information on the threshold-v oltage shift at low dose rates for power MOSFETs.