The applicability of MIL-STD-883D Method 1019.4 to predicting the low-
dose-rate radiation response of non-hardened power MOSFETs has been in
vestigated. Method 1019.4 works well in providing bounds for the thres
hold-voltage shift. However, it is not intended to provide an estimate
of the actual DELTAV(T) due to low-dose-rate irradiation. A modified
method is proposed which can yield more information on the threshold-v
oltage shift at low dose rates for power MOSFETs.