USING REFLECTRON TIME-OF-FLIGHT MASS-SPECTROMETER TECHNIQUES TO INVESTIGATE CLUSTER DYNAMICS AND BONDING

Citation
Sq. Wei et Aw. Castleman, USING REFLECTRON TIME-OF-FLIGHT MASS-SPECTROMETER TECHNIQUES TO INVESTIGATE CLUSTER DYNAMICS AND BONDING, International journal of mass spectrometry and ion processes, 131, 1994, pp. 233-264
Citations number
92
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
ISSN journal
01681176
Volume
131
Year of publication
1994
Pages
233 - 264
Database
ISI
SICI code
0168-1176(1994)131:<233:URTMTT>2.0.ZU;2-C
Abstract
Laser based time-of-flight mass spectrometer systems affixed with refl ectrons are valuable tools for investigating cluster dynamics and reac tions, spectroscopy and structures. Utilizing the reflectron time-of-f light mass spectrometer techniques, both decay fractions and kinetic e nergy releases of metastable cluster ions can be measured with high pr ecision. By applying related theoretical models, the desired thermoche mical values of metastable species can be deduced, which are otherwise very difficult to obtain. Several examples are discussed with attenti on focused on ammonia as a test case for hydrogen bond systems, and xe non for weaker van der Waals clusters. A brief overview of application s to investigating solvation effects on reactions and structures, dela yed electron transfer and ionization through intracluster Penning ioni zation, is also given.