INTEGRATION OF RESONANT-TUNNELING TRANSISTORS AND HOT-ELECTRON TRANSISTORS

Citation
Ts. Moise et al., INTEGRATION OF RESONANT-TUNNELING TRANSISTORS AND HOT-ELECTRON TRANSISTORS, IEEE electron device letters, 15(7), 1994, pp. 254-256
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
07413106
Volume
15
Issue
7
Year of publication
1994
Pages
254 - 256
Database
ISI
SICI code
0741-3106(1994)15:7<254:IORTAH>2.0.ZU;2-4
Abstract
We have integrated a tunneling hot-electron transfer amplifier (THETA) and a novel resonant-tunneling hot-electron transfer amplifier (RTHET A) within a single epitaxial growth. At room temperature, the THETA ex hibits a common-emitter current gain of greater than six and a voltage swing of 800 mV when measured in an inverter configuration. The RTHET A exhibits similar common-emitter current gain and a four-state voltag e transfer characteristic with an output voltage swing of 1 V. In cont rast to the resonant-tunneling hot-electron transistor (RHET), the RTH ETA exhibits current gain both before and after the resonant peak volt age. From on-wafer S-parameter measurements, the current-gain cut-off frequency (f(T)) and the maximum frequency of oscillation (f(max)) for both transistors are approximately 20 GHz and 9 GHz, respectively.