ION-BEAM MODIFICATION OF FULLERENE FILMS AND THEIR FRICTIONAL BEHAVIOR

C60 films were deposited on a variety of substrates by thermal evapora tion. The presence Of C60 in the films was confirmed by Transmission E lectron Microscopy and Raman spectroscopic analysis. The C60 films exh ibited an average friction coefficient of 0.4-0.5. The films were irra diated with 2 MeV Ag+ and B+ ions at various doses. High energy ion bo mbardment created damage that resulted in partly crystalline to amorph ous films, dependent on the mass and dose of ions. The amorphous films showed a friction coefficient of <0.1. Partly crystalline films showe d a friction coefficient at the same level as that of unirradiated fil ms.