LOW-TEMPERATURE ELECTRONIC TRANSPORT MEASUREMENTS ON A GATED DELTA-DOPED GAAS SAMPLE - MAGNETORESISTANCE, QUANTUM HALL-EFFECT AND CONDUCTIVITY FLUCTUATIONS
R. Dotzer et al., LOW-TEMPERATURE ELECTRONIC TRANSPORT MEASUREMENTS ON A GATED DELTA-DOPED GAAS SAMPLE - MAGNETORESISTANCE, QUANTUM HALL-EFFECT AND CONDUCTIVITY FLUCTUATIONS, Semiconductor science and technology, 9(7), 1994, pp. 1332-1339
We present magnetotransport measurements (up to 7 T) performed at very
low temperatures (down to 20 mK) on a GaAs sample containing two para
llel delta-doped layers whose carrier concentration can be varied by m
eans of a gate electrode. With increasing negative gate voltage the re
sistance becomes,more strongly temperature-dependent, indicating a mor
e localized electron system. The magnetoresistance is found to be stro
ngly anisotropic. When the field is parallel to the layers we find a l
arge positive magnetoresistance which we attribute to orbital shrinkin
g of the strongly localized donor wavefunction. In contrast, in the pe
rpendicular orientation, we observe a strong negative magnetoresistanc
e at low fields whose origin remains unclear, and the quantum Hall eff
ect at larger fields. At low gate voltages both delta-layers are in th
e quantum Hall state whereas at larger negative voltages the layer adj
acent to the gate becomes insulating. In the case of strong depletion
the high-ohmic sample shows reproducible conductivity fluctuations as
a function of either the gate voltage or the magnetic field. The fluct
uations diminish at higher temperatures and larger measuring currents.