Ec. Lightowlers et al., HYDROGEN-RELATED LUMINESCENCE-CENTERS IN THERMALLY TREATED CZOCHRALSKI SILICON, Semiconductor science and technology, 9(7), 1994, pp. 1370-1374
The I-line (0.9650 eV), T-line (0.9351 eV) and several other luminesce
nce centres created by annealing Czochralski silicon at 450-degrees-C
are all shown to incorporate one hydrogen atom, from observed deuteriu
m-hydrogen isotope structure, and mainly one carbon atom deduced from
carbon isotope structure. It is also demonstrated that hydrogen is a c
ommon contaminant in silicon and that it can be readily introduced by
thermal treatments at 450-degrees-C in the presence of water vapour or
gaseous hydrogen. With increasing hydrogen content, the luminescence
from the centres decreases, implying that if more than one hydrogen at
om is captured by a centre it becomes optically inactive.