Dw. Mccomb et al., SCANNING-TUNNELING-MICROSCOPY INVESTIGATION OF THE NUCLEATION AND GROWTH OF AG SI(111)-(ROOT-3X-ROOT-3)/, Physical review. B, Condensed matter, 49(24), 1994, pp. 17139-17148
The scanning tunneling microscope has been used to identify and distin
guish between various stages of reactive growth of Ag on Si(111)-(7 X
7) at 450-degrees-C. Continuous investigation of the reaction trend wa
s made possible by producing a concentration gradient of Ag on the sub
strate. The surface features observed, such as hole-island pairs, are
dependent on the sample coverage. Mechanisms for the formation of Ag/S
i(111)-(square-root 3 X square-root 3) are proposed, and experimental
confirmation of their validity is presented. Antiphase boundaries betw
een neighboring (square-root 3 X square-root 3) domains have been obse
rved, and a model for the atomic structure across such a boundary is s
hown. At near monolayer coverages small regions that exhibit the Si(11
1)-(1 X 1) structure have been identified.