LOW-TEMPERATURE OPERATION OF SILICON-ON-INSULATOR INVERTERS

This paper describes the cryogenic operation of partially depleted Sil icon-On-Insulator inverters. As is shown, the floating operation yield s a degradation of the transfer characteristics, which increases upon cooling. Additionally, at cryogenic temperatures, hysteresis effects, further deteriorate the performance. These observations will be discus sed in view of the cryogenic SOI MOSFET characteristics and anomalies. Finally, the impact of the so-called twin-gate configuration on the i mprovement of the inverter characteristics at low temperatures will be demonstrated and discussed.